Beryllium-incorporated ScAlN/GaN HEMTs with low off-current and high current stress stability
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由 用户N70KVU 发布于 2026-09-19 11:22
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由 用户N70KVU 发布于 2026-09-19 11:22
作者：
Jie Zhang, Md Tanvir Hasan, Shubham Mondal, Zhengwei Ye, Jiangnan Liu, Md Mehedi Hasan Tanim, Yuyang Chen, Sangyong Lee, Dongjae Shin, Yiyang Li, Kai Sun, Zetian Mi
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2026-09-19
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Beryllium-incorporated ScAlN/GaN HEMTs with low off-current and high current stress stability
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